A Review of Particle Size Analysis with X-ray CT.

A Review of Particle Size Analysis with X-ray CT.
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DOI:
10.3390/ma16031259
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发表时间:
2023-02-01
期刊:
影响因子:
3.4
通讯作者:
Worden, Richard H.
Worden, Richard H.
中科院分区:
材料科学3区
文献类型:
--
作者:
Behnsen, Julia G.;Black, Kate;Houghton, James E.;Worden, Richard H.

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粒度和形态分析是广泛应用中常见的问题,包括增材制造、地质和农业材料表征、食品制造和制药。在这里,我们回顾使用微焦点X射线计算机断层扫描(X射线CT)的颗粒分析。我们概述了不同的样品制备方法,图像处理协议,可以确定的形态参数,以及适用于使用X射线CT进行粒度分析的材料类型。的主要结论是,可以确定颗粒的尺寸和形状参数大于约2至3米,给定足够的分辨率的X射线CT设置。由高原子序数材料(Z > 40)组成的颗粒需要仔细的样品制备,以确保X射线透射。当具有广泛尺寸范围的颗粒紧密堆积在一起时,或者当颗粒熔融(烧结或胶结)时,会出现问题。使用X射线CT进行粒度分析有望变得越来越普遍,在一次X射线CT扫描中提供大量颗粒的尺寸,形状和孔隙度的测量。
Particle size and morphology analysis is a problem common to a wide range of applications, including additive manufacturing, geological and agricultural materials’ characterisation, food manufacturing and pharmaceuticals. Here, we review the use of microfocus X-ray computed tomography (X-ray CT) for particle analysis. We give an overview of different sample preparation methods, image processing protocols, the morphology parameters that can be determined, and types of materials that are suitable for analysis of particle sizes using X-ray CT. The main conclusion is that size and shape parameters can be determined for particles larger than approximately 2 to 3 m, given adequate resolution of the X-ray CT setup. Particles composed of high atomic number materials (Z > 40) require careful sample preparation to ensure X-ray transmission. Problems occur when particles with a broad range of sizes are closely packed together, or when particles are fused (sintered or cemented). The use of X-ray CT for particle size analysis promises to become increasingly widespread, offering measurements of size, shape, and porosity of large numbers of particles within one X-ray CT scan.
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