Non-destructive reversible resistive switching in Cr doped Mott insulator Ca2RuO4: Interface vs bulk effects
Non-destructive reversible resistive switching in Cr doped Mott insulator Ca2RuO4: Interface vs bulk effects
复制标题
掺铬莫特绝缘体 Ca2RuO4 中的无损可逆电阻切换:界面效应与体效应
DOI:
10.1063/1.5008650
复制
发表时间:
2017
影响因子:
3.2
通讯作者:
M. Tsoi
中科院分区:
文献类型:
--
作者:
Shida Shen;Morgan C. Williamson;G. Cao;Jianshi Zhou;J. Goodenough;M. Tsoi
A non-destructive reversible resistive switching is demonstrated in single crystals of Cr-doped Mott insulator Ca2RuO4. An applied electrical bias was shown to reduce the DC resistance of the crystal by as much as 75%. The original resistance of the sample could be restored by applying an electrical bias of opposite polarity. We have studied this resistive switching as a function of the bias strength, applied magnetic field, and temperature. A combination of 2-, 3-, and 4-probe measurements provide a means to distinguish between bulk and interfacial contributions to the switching and suggests that the switching is mostly an interfacial effect. The switching was tentatively attributed to electric-field driven lattice distortions which accompany the impurity-induced Mott transition. This field effect was confirmed by temperature-dependent resistivity measurements which show that the activation energy of this material can be tuned by an applied DC electrical bias. The observed resistance switching can potent...