Measurement and Analysis of Electromagnetic Information Leakage From Printed Circuit Board Power Delivery Network of Cryptographic Devices
Measurement and Analysis of Electromagnetic Information Leakage From Printed Circuit Board Power Delivery Network of Cryptographic Devices
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DOI：
10.1109/temc.2021.3062417
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发表时间：
2021-03
影响因子：
2.1
通讯作者：
Shinpei Wada;Y. Hayashi;Daisuke Fujimoto;N. Homma;Youngwoo Kim
中科院分区：
文献类型：
--
作者：
Shinpei Wada;Y. Hayashi;Daisuke Fujimoto;N. Homma;Youngwoo Kim
本文提出了一种新的测量和分析加密设备的印刷电路板（PCB）供电网络（PDN）电磁信息泄漏的方法。提出了一种基于相关电磁分析（CEMA）的精确电磁信息泄露分析方法，该方法考虑了高级加密标准（AES）的工作周期和时钟频率。我们测量了PCB级AES核心PDN上的场分布，并提出了导出信息泄漏图的分析方法。利用该方法首次验证了电磁信息泄漏与PCB PDN上主场分布的强度有关。我们验证了整个秘密密钥信息可以从PCB PDN中远离加密集成电路的位置提取，其中由于PCB PDN的物理结构，特定字段占主导地位。在测量分析结果的基础上，讨论了一种基于优势场辐射的电磁信息泄漏评估方法。我们评估了PCB背面去耦电容的电磁信息泄漏。最后，我们提出了一种抑制PCB PDN中电磁信息泄漏的设计方法。
This article presents a novel measurement and analysis of electromagnetic (EM) information leakage from printed circuit board (PCB) power delivery network (PDN) of cryptographic devices. We propose an accurate EM information leakage analysis method based on a correlation electromagnetic analysis (CEMA) considering advanced encryption standard (AES) operation cycles and clock frequency. We measure field distribution on the PCB level AES core PDN and conduct the proposed analysis method to derive the information leakage maps. For the first time, we verified that the EM information leakage depends on the intensity of dominant field distribution on the PCB PDN using the proposed method. We validated that the whole secret key information can be extracted from locations in the PCB PDN distant from the cryptographic integrated circuit where a specific field is dominant due to the physical structure of the PCB PDN. Based on the measurement and analysis results, we discuss an efficient EM information leakage evaluation method based on the dominant field radiation. We evaluate the EM information leakage from the decoupling capacitor in the backside of the PCB. Finally, we propose a design methodology to suppress the EM information leakage from the PCB PDN.