Deuterium Trapping in Rolled Polycrystalline Tungsten Exposed to Low Energy Plasma
Deuterium Trapping in Rolled Polycrystalline Tungsten Exposed to Low Energy Plasma
复制标题
DOI：
10.1585/pfr.7.1405105
复制
发表时间：
2012-07
影响因子：
0.8
通讯作者：
A. Rusinov;M. Sakamoto;H. Zushi;R. Ohyama;K. Honda;I. Takagi;T. Tanabe;N. Yoshida
中科院分区：
文献类型：
--
作者：
A. Rusinov;M. Sakamoto;H. Zushi;R. Ohyama;K. Honda;I. Takagi;T. Tanabe;N. Yoshida
采用晶粒伸长方向与表面平行和垂直的多晶钨样品，研究了低能等离子体辐照后的氚保留情况。在450-750K的辐照温度范围内，由TDS谱计算出垂直于晶粒伸长方向的样品的氚保留量是平行取向样品的2~10倍。再结晶消除了晶界伸长各向异性，消除了两种样品的氚保留率差异。在样品的近表层没有观察到气泡和水泡。等离子体辐照应该产生高能缺陷，这是导致氚滞留的原因。这两种样品的保持率的差异似乎归因于不同的晶粒伸长方向的有效扩散系数的不同。C
Deuterium retention after low energy plasma exposure was investigated using the polycrystalline tungsten samples of which grain elongation directions are parallel and perpendicular with respect to the surface. The deuterium retention calculated from TDS spectra is 2-10 times larger in the sample with perpendicular grain elongation direction than in the parallel one for the irradiation temperatures of 450-750K. Removing of the grain elongation anisotropy by the recrystallization resulted in disappearance of the difference in the deuterium retention of the both kinds of samples. No bubbles and no blisters have been observed in the near surface layer of the samples. Plasma irradiation should produce high energy defects that are responsible for the deuterium retention. The difference in the retention of the both kinds of samples seems to be attributed to the different effective diffusion coefficients depending on the grain elongation direction. c