Secondary-ion yields from surfaces bombarded with keV molecular and cluster ions.
Secondary-ion yields from surfaces bombarded with keV molecular and cluster ions.
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用 keV 分子和簇离子轰击的表面产生二次离子。
DOI：
10.1103/physrevlett.63.1625
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发表时间：
1989
影响因子：
8.6
通讯作者：
E. Schweikert
中科院分区：
文献类型：
--
作者：
M. Blain;S. Della;H. Joret;Y. Beyec;E. Schweikert
我们测量了5-28keV的络离子轰击苯丙氨酸、CsI和Au的负次离子产额。主要离子为有机单体和二聚体离子以及CSI的簇状离子。对于更复杂的射弹，测量到的二次离子产额有了很大的提高。结果表明，Au-−原子的二次离子产额与入射动量的平方有关
We have measured negative secondary-ion yields from phenylalanine, CsI, and Au bombarded by complex ions of 5-28 keV. The primary ions were organic monomer and dimer ions and clusters of CsI. Large enhancements occur in the measured secondary-ion yields for more complex projectiles. We show that secondary-ion yields of Au − atomic species are related to the square of the projectile momentum