Scanning laser THz imaging system
Scanning laser THz imaging system
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DOI：
10.1088/0022-3727/47/37/374007
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发表时间：
2014-08
期刊：
影响因子：
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通讯作者：
H. Murakami;K. Serita;Y. Maekawa;S. Fujiwara;Eiki Matsuda;Sunmi Kim;I. Kawayama;M. Tonouchi
中科院分区：
文献类型：
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作者：
H. Murakami;K. Serita;Y. Maekawa;S. Fujiwara;Eiki Matsuda;Sunmi Kim;I. Kawayama;M. Tonouchi
激光太赫兹（THz）发射显微镜（LTEM）是一种独特的检测工具，它可以直接二维映射各种电子材料和器件的THz脉冲发射。因此，二维映射通过可视化电场、超电流、铁电畴结构、磁通量等的分布直接产生各种物理信息。基于传统的LTEM技术，我们开发了一种功能更强大的激光太赫兹成像系统，包括扫描激光太赫兹具有高速和高分辨率性能的（近场）成像系统，与用于高分辨率成像的原子力显微镜耦合的扫描探针LTEM，和一个动态太赫兹发射显微镜，以研究超快载流子动力学的二维样品。这些系统具有不同的特性，使其适用于各种应用。我们来看看这些系统和一些典型的应用。
The laser terahertz (THz) emission microscope (LTEM) is a unique inspection tool which can directly two-dimensionally map the THz pulse emission from a variety of electric materials and devices. Thus, two-dimensional mapping directly yields various physical information by visualizing the distributions of electric field, supercurrent, ferroelectric domain structures, magnetic fluxes, etc. Based on techniques created for conventional LTEM, we have developed a more highly functional laser THz imaging system, including a scanning laser THz (near-field) imaging system having the performance of high-speed and high-resolution, a scanning probe LTEM coupled with an atomic force microscope for high-resolution imaging, and a dynamic THz emission microscope to investigate the ultrafast carrier dynamics two-dimensionally in the sample. These systems offer diverse characteristics, making them suitable for various applications. We take a look at these systems and some typical applications.