Athermalization in atomic force microscope based force spectroscopy using matched microstructure coupling.
Athermalization in atomic force microscope based force spectroscopy using matched microstructure coupling.
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DOI：
10.1063/1.3167276
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发表时间：
2009-07
期刊：
影响因子：
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通讯作者：
H. Torun;O. Finkler;F. Degertekin
中科院分区：
文献类型：
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作者：
H. Torun;O. Finkler;F. Degertekin
作者描述了一种用于原子力显微镜（AFM）的力谱应用中的无热化方法，该方法使用与AFM探针热机械匹配的微结构。该方法使用的设置，其中的AFM探针与匹配的结构和两个结构的位移被同时读出耦合。匹配结构随着温度的变化与AFM探针一起位移，因此施加到样品上的力可以保持恒定，而不需要单独的反馈回路用于热漂移补偿，并且差分信号可以用于抵消AFM的零力水平的偏移。
The authors describe a method for athermalization in atomic force microscope (AFM) based force spectroscopy applications using microstructures that thermomechanically match the AFM probes. The method uses a setup where the AFM probe is coupled with the matched structure and the displacements of both structures are read out simultaneously. The matched structure displaces with the AFM probe as temperature changes, thus the force applied to the sample can be kept constant without the need for a separate feedback loop for thermal drift compensation, and the differential signal can be used to cancel the shift in zero-force level of the AFM.