Electrostatic forces acting on the tip in atomic force microscopy: Modelization and comparison with analytic expressions
Electrostatic forces acting on the tip in atomic force microscopy: Modelization and comparison with analytic expressions
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DOI：
10.1063/1.363884
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发表时间：
1997-02-01
影响因子：
3.2
通讯作者：
Leveque, G
中科院分区：
文献类型：
--
作者：
Belaidi, S;Girard, P;Leveque, G
利用等效电荷分布模型，精确计算了原子力显微镜真实的针尖所受的静电力。该模型适用于导电平面前面的导电尖端。我们比较了等效电荷模型与几个解析模型，迄今用来近似的静电力，并讨论其有效性程度。我们估计的贡献的悬臂梁的总的力，并表明，在理论计算和实验结果的基础上，悬臂梁的贡献可能构成的静电力在空气中的静电力显微镜中使用的距离范围内的重要组成部分。(C)1997年美国物理学会。
With the model of equivalent charge distribution, we calculated the exact electrostatic force acting on the real (conical) tip of an atomic force microscope. This model applies to a conductive tip in front of a conductive plane. We compared the equivalent charge model with several analytic models used to date to approximate the electrostatic forces and discussed their degree of validity. We estimated the contribution of the cantilever to the total force and showed, on the basis of theoretical calculations and experimental results, that the contribution of cantilever may constitute the essential part of the electrostatic force in the range of distances used in electrostatic force microscopy in the air. (C) 1997 American Institute of Physics.