Microscopic evidence for4flocalization with reduced particle size in correlated electron system CePd3
Microscopic evidence for4flocalization with reduced particle size in correlated electron system CePd3
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相关电子系统 CePd3 中 4f 局域化与粒径减小的微观证据
DOI：
10.1103/physrevb.87.125125
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发表时间：
2013
期刊：
影响因子：
--
通讯作者：
E. Sampathkumaran
中科院分区：
文献类型：
--
作者：
S. Mohanta;S. Mishra;K. Iyer;E. Sampathkumaran
本文报道了用时间微分扰动角关联技术测量的纳米晶CePd中Cd杂质的磁超精细场与温度的关系。随着颗粒尺寸的减小，我们发现Cd的超精细场逐渐增加，这表明对于尺寸小于60 nm的纳米颗粒，具有Curie-Weiss样的温度依赖性。补充体磁化率和等温磁化强度测量，我们的数据显示相关电子系统CePd的纳米粒子中的本地化的微观证据。
We report the temperature dependence of magnetic hyperfine field,, forCd impurity in nanocrystalline CePdmeasured using the time differential perturbed angular correlation technique. With a reduction of particle size, we find progressive increase in the hyperfine field of Cd which shows Curie-Weiss-like temperature dependence for nanoparticles smaller than 60 nm in size. Supplemented by bulk susceptibility and isothermal magnetization measurements, our data show microscopic evidence forlocalization in nanoparticles of correlated electron system CePd.