The modular small-angle X-ray scattering data correction sequence.
The modular small-angle X-ray scattering data correction sequence.
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DOI：
10.1107/s1600576717015096
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发表时间：
2017-12-01
影响因子：
6.1
通讯作者：
Thünemann AF
中科院分区：
文献类型：
--
作者：
Pauw BR;Smith AJ;Snow T;Terrill NJ;Thünemann AF
提出了一种数据校正序列，包括从原始探测器信号中提取小角X射线散射截面的有序基本步骤。它适用于广泛的样品，包括固体和分散体。数据校正可能是小角度X射线散射实验用户最不喜欢的活动：如果做得不够好，这可能只在数据分析阶段才变得明显，需要从头开始重复数据校正。这里提出了一个建议的基本数据校正步骤的综合序列，以减轻与数据校正相关的困难，在实验室和同步加速器。当以所提出的顺序应用于原始信号时，所得到的绝对散射截面将为非常广泛的样品提供高度的准确性，其值伴随着不确定性估计。该方法可以不加修改地应用于任何具有光子计数直接探测面探测器的针孔准直仪器。
A data correction sequence is presented, consisting of ordered elementary steps that extract the small-angle X-ray scattering cross section from the original detector signal(s). It is applicable to a wide range of samples, including solids and dispersions. Data correction is probably the least favourite activity amongst users experimenting with small-angle X-ray scattering: if it is not done sufficiently well, this may become evident only during the data analysis stage, necessitating the repetition of the data corrections from scratch. A recommended comprehensive sequence of elementary data correction steps is presented here to alleviate the difficulties associated with data correction, both in the laboratory and at the synchrotron. When applied in the proposed order to the raw signals, the resulting absolute scattering cross section will provide a high degree of accuracy for a very wide range of samples, with its values accompanied by uncertainty estimates. The method can be applied without modification to any pinhole-collimated instruments with photon-counting direct-detection area detectors.