Two- and Three-Dimensional Analyses of Surfaces According to the E-System:
Two- and Three-Dimensional Analyses of Surfaces According to the E-System:
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根据 E 系统对表面进行二维和三维分析：
DOI：
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发表时间：
1974
期刊：
影响因子：
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通讯作者：
V. Radhakrishnan
中科院分区：
文献类型：
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作者：
M. Shunmugam;V. Radhakrishnan
粗糙度测量的E系统可用于表面粗糙度的二维或三维评估。简要解释了从数字化剖面计算二维和三维包络的程序。该方法可用于验证实际仪器的测量结果。E-系统的滤波特性，用于二维和三维粗糙度测量时，分析与参考的理论配置文件。利用计算机模拟的双曲滑橇对各种滑橇构型进行了研究。
The E-system of roughness measurement can be used either for a two-dimensional or a three-dimensional assessment of surface roughness. The procedure for computing the two- and three-dimensional envelopes from digitized profiles is briefly explained. This method will be useful for verifying the results obtained by practical instruments. The filtering characteristic of the E-system, when used for two- and three-dimensional roughness measurement, is analysed with reference to theoretical profiles. Various skid configurations are studied using a doubly curved skid simulated by a computer.