A high sensitivity system for luminescence measurement of materials.
A high sensitivity system for luminescence measurement of materials.
复制标题
DOI：
10.1002/bio.3606
复制
发表时间：
2019-02
期刊：
影响因子：
--
通讯作者：
A. Finch;Yafang Wang;P. Townsend;M. Ingle
中科院分区：
文献类型：
--
作者：
A. Finch;Yafang Wang;P. Townsend;M. Ingle
介绍了一种独特的多学科组合式波长多路复用光谱仪。它配备了高灵敏度的成像板探测器，其电源可以门控以提供时间分辨的数据。该系统能够收集X射线激发[放射性发光（RL）或X射线激发光学发光（XEOL）]、电子辐照[阴极发光（CL）]和发光二极管（LED）可见光[光致发光（PL）]后的光谱分辨发光数据。可以收集时间分辨的PL和CL数据，以提供微秒时间范围内半衰期的寿命估计。有温度阶段的高，低温实验提供温度控制从20至673 K。结合辐射、时间分辨（TR）和TR-PL允许光谱分辨的热释光（TL）和光学受激发光（OSL）。两个探测器与匹配的光栅的设计提供了最佳的灵敏度的系统。列举了一些实例，说明该光谱仪的优点和多用途。潜在的未来实验，包括寿命分析作为辐照，剂量和温度的函数加泵探测实验进行了讨论。
A unique combined and multi-disciplinary wavelength multiplexed spectrometer is described. It is furnished with high-sensitivity imaging plate detectors, the power to which can be gated to provide time-resolved data. The system is capable of collecting spectrally resolved luminescence data following X-ray excitation [radioluminescence (RL) or X-ray excited optical luminescence (XEOL)], electron irradiation [cathodoluminescence (CL)] and visible light from light emitting diodes (LEDs) [photoluminescence (PL)]. Time-resolved PL and CL data can be collected to provide lifetime estimates with half-lives from microsecond timeframes. There are temperature stages for the high and low temperature experiments providing temperature control from 20 to 673 K. Combining irradiation, time resolved (TR) and TR-PL allows spectrally-resolved thermoluminescence (TL) and optically stimulated luminescence (OSL). The design of two detectors with matched gratings gives optimum sensitivity for the system. Examples which show the advantages and multi-use of the spectrometer are listed. Potential future experiments involving lifetime analysis as a function of irradiation, dose and temperature plus pump-probe experiments are discussed.