SPIN@U‐70: An Experiment to Measure the Analyzing Power An in Very‐high‐P⊥2 p‐p Elastic Scattering at 70 GeV
SPIN@U‐70: An Experiment to Measure the Analyzing Power An in Very‐high‐P⊥2 p‐p Elastic Scattering at 70 GeV
复制标题
SPIN@U-70：测量 70 GeV 甚高-P⊥2 p-p 弹性散射中分析功率 An 的实验
DOI：
10.1063/1.1607193
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发表时间：
2003
期刊：
影响因子：
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通讯作者：
A. Zelenski
中科院分区：
文献类型：
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作者：
V. Luppov;L. Alexeeva;V. Anferov;E. Courant;Y. Derbenev;G. Fidecaro;M. Fidecaro;F. Khiari;S. V. Koutin;A. D. Krisch;M. Leonova;A. Lin;W. Lorenzon;V. Morozov;D. Peaslee;C. Peters;R. Raymond;D. Sivers;J. A. Stewart;S. Varzar;V. K. Wong;K. Yonehara;D. Crabb;Y. Ado;A. Afonin;V. Belousov;B. Chujko;A. Davidenko;N. Galyaev;V. Garkusha;V. Grishin;V. Kachanov;Y. Kharlov;V. Kotov;A. Kusnetsov;V. Medvedev;Y. Melnik;V. Mochalov;A. Mysnik;S. Nurushev;A. Prudkoglyad;P. Semenov;V. Solovianov;V. P. Stepanov;V. Teplyakov;S. Troshin;A. Ufimtsev;M. Ukhanov;A. Yakutin;V. Zapolsky;V. Zarucheisky;N. Borisov;V. Fimushkin;V. Nikitin;P. Nomokonov;I. Rufanov;Y. Pilipenko;P. Delheij;W. Oers;A. Zelenski
SPIN@U-70实验计划测量70 GeV质子-质子弹性散射的单自旋分析能力An，其大的P ε 2值为1至12（GeV/c）2。密歇根州的冷冻NH3极化质子靶（固体PPT）应稍后安装在IHEP，Protvino的70 GeV U-70加速器的通道8提取束线中。前向散射质子由放置在PPT约9 m处的小型闪烁计数器检测，而反冲散射质子由35 m长的聚焦磁谱仪检测，该磁谱仪具有12度垂直弯曲，放置在与束成30度的位置。2002年4月，在IHEP进行了一次使用聚乙烯靶测试光束和光谱仪的调整运行。文中给出了试验的布局和结果。
The SPIN@U‐70 experiment plans to measure the one‐spin analyzing power An for 70 GeV proton‐proton elastic scattering at large P⊥2 values of 1 to 12 (GeV/c)2. The Michigan frozen NH3 polarized proton target (Solid PPT) should later be installed in the Channel 8 extracted beam‐line of the 70 GeV U‐70 accelerator in IHEP, Protvino. The forward‐scattered protons are detected by small scintillation counters placed at about 9 m from the PPT, while the recoil‐scattered protons are detected by a 35‐m‐long focusing magnetic spectrometer, with a 12 degree vertical bend, placed at 30 degrees to the beam. A tune‐up run for testing the beam and the spectrometer, using a polyethylene target, was carried out in April 2002 at IHEP. The layout and the results of the test run are presented.