Scanning Tunneling Microscopic Techniques Applied To Roughness Of Silver Surfaces
Scanning Tunneling Microscopic Techniques Applied To Roughness Of Silver Surfaces
复制标题
扫描隧道显微技术应用于银表面的粗糙度
DOI：
10.1117/12.949179
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发表时间：
1989
期刊：
影响因子：
--
通讯作者：
J. Gimzewski
中科院分区：
文献类型：
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作者：
J. Gimzewski
表面的形状是决定其性能的一个重要因素。同样，表面的制备也决定了它们的形状。在微观层面上理解这些过程需要各种复杂的探针，每种探针都有其局限性和优势。扫描隧道显微镜（STM）虽然是这一领域的新人，但它具有以非常高的分辨率研究表面性质的能力。在本文中，我讨论了STM技术对银表面粗糙度的应用，其中表面粗糙度是通过各种制备方法、表面吸附和STM本身的结构产生的。还给出了提供光谱信息的局部探针的例子。涵盖了与粗糙表面研究相关的限制和问题，并展望了STM在粘附、摩擦和工程等其他领域的适用性。最后，我将讨论从STM的尖端表面区域发射光子的一些初步结果。在隧道模式下，银薄膜在光学范围内具有较大的光子强度。这些研究证明了STM和光学科学之间有趣的联系。
The shape of surfaces can be an important factor determining their properties. Likewise, the preparation of surfaces determines their shape. Understanding such processes on the microscopic level requires a variety of sophisticated probes, each with their limitations and advantages. The scanning tunneling microscope (STM), although a newcomer in this area, has the power to investigate surface properties with very high resolution. In this paper I discuss the application of STM techniques to the roughness of silver surfaces, where the roughness of the surface is generated by a variety of preparation methods, by adsorption on the surface, and by creation of structures with the STM itself. Examples are also given of local probes that provide spectroscopic information. Limitations and problems associated with the investigation of rough surfaces are covered, as well as an outlook to the applicability of STM to other areas such as adhesion, friction and engineering given. Finally I shall discuss some of the first results on the emission of photons from the tip-surface region of the STM. In the tunnel mode a large photon intensity is found in the optical range for silver films. These studies demonstrate an interesting link between STM and optical science.