Fast imaging polarimetry with precision universal compensator
Fast imaging polarimetry with precision universal compensator
复制标题
带精密通用补偿器的快速成像偏振测量
DOI：
10.1117/12.186681
复制
发表时间：
1994
期刊：
影响因子：
3.6
通讯作者：
R. Oldenbourg
中科院分区：
文献类型：
--
作者：
G. Mei;R. Oldenbourg
提出了一种新型成像偏振仪，用于双折射精细结构的快速、与方位无关的测量。新的成像偏振仪被实现为一个偏振光学显微镜，其中包含一个由两个电光调制器组成的精密通用补偿器。摄像机和计算机辅助图像分析系统在构成视场的图像的所有点提供对样品中的光学各向异性(延迟幅度和方位角)的快速测量。这些图像记录了标本薄层光学切片中的精细结构和分子组织。目前仪器的灵敏度为0.1 nm的样品延迟，在所有640×480个图像点上在0.43秒内测量。给出了双折射精细结构的测量实例。
A new type of imaging polarimeter for fast and orientation independent measurement of birefringent fine structures is proposed. The new imaging polarimeter was implemented as a polarized light microscope incorporating a precision universal compensator made of two electro-optic modulators. A video camera and computer-assisted image analysis system provide fast measurements of optical anisotropy (retardance magnitude and azimuth) in the specimen at ALL POINTS of the image constituting the field of view. The images document fine structural and molecular organization within a thin optical section of the specimen. The sensitivity of the current instrument is 0.1 nm of specimen retardance, measured in 0.43 seconds at all 640 X 480 image points. Examples of measurements of birefringent fine structures are presented.