Comparing the effectiveness of deterministic bridge fault and multiple-detect stuck fault patterns for physical bridge defects: A simulation and silicon study
Comparing the effectiveness of deterministic bridge fault and multiple-detect stuck fault patterns for physical bridge defects: A simulation and silicon study
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比较确定性桥梁故障和物理桥梁缺陷的多重检测卡住故障模式的有效性：模拟和硅研究
DOI：
10.1109/test.2009.5355762
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发表时间：
2009
期刊：
影响因子：
--
通讯作者：
Mark Ward
中科院分区：
文献类型：
--
作者：
S. Goel;Narendra Devta;Mark Ward
特征尺寸的缩小和导线密度的增加增加了发生与桥相关的缺陷的可能性。基于N-检测的模式集是提高桥梁缺陷检测效率的常用方法。然而，要获得高的桥梁覆盖率，需要从物理布局和桥梁故障模式生成中提取确定性的桥梁站点。本文对两种大型设计(90 nm和65 nm)的确定性桥故障模式和n检测模式的有效性进行了全面的比较分析。我们指出，提取不同类型的桥梁故障是必要的，因为它们代表了不同的唯一缺陷位置。仿真结果表明，n-检测模式的桥梁复盖性能很差，常用的度量桥梁复盖估计(BCE)与真实的桥梁故障复盖无关。最后，我们讨论了DPPM对确定性电桥故障和90 nm设计的n检测固定图案的影响。
Shrinking feature size and increased wire density increase the likelihood of occurrence of bridge related defects. N- detect based pattern sets are used commonly to improve the detection of bridge defects. However, achieving high bridge coverage requires deterministic bridge sites extraction from physical layout and bridge fault pattern generation. In this paper, we present a comprehensive comparative analysis about the effectiveness of deterministic bridge fault patterns and n-detect patterns for two large designs (90 and 65nm). We show that extracting different types of bridge faults is required as they represent different unique defect sites. Simulation results show that n-detect patterns have very poor bridge coverage performance and commonly used metric bridge coverage estimate (BCE) does not relate to the true bridge fault coverage. Finally, we discuss the DPPM impact for deterministic bridge fault and n-detect stuck-at patterns for the 90nm design.