Interfacial micropore defect formation in PEDOT:PSS-Si hybrid solar cells probed by TOF-SIMS 3D chemical imaging.
Interfacial micropore defect formation in PEDOT:PSS-Si hybrid solar cells probed by TOF-SIMS 3D chemical imaging.
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DOI：
10.1021/ac401084x
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发表时间：
2013-06
影响因子：
7.4
通讯作者：
J. P. Thomas;Liyan Zhao;Marwa Abd-Ellah;N. Heinig;K. Leung
中科院分区：
文献类型：
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作者：
J. P. Thomas;Liyan Zhao;Marwa Abd-Ellah;N. Heinig;K. Leung
在n型Si上导电的p型聚合物层已经被广泛研究用于制造具有成本效益的混合太阳能电池。在这项工作中，飞行时间二次离子质谱（TOF-SIMS）是用来提供三维化学成像的界面之间的聚（3，4-乙烯-二氧噻吩）：聚苯乙烯磺酸（PEDOT：PSS）和SiOx/Si的混合太阳能电池。为了最大限度地减少对聚合物层的结构损伤，使用Ar簇溅射源进行深度剖析。本研究结果表明，在SiOx/Si衬底上的PEDOT：PSS层的界面区域中形成了缺陷。随着原生氧化物层厚度的增加，这种界面缺陷的形成变得更加突出，这是极大地影响混合太阳能电池性能的关键器件参数。三维化学成像与Ar团簇离子溅射耦合，因此已被证明是一种新兴的技术，用于探测这种和其他聚合物-无机系统的界面。
Conducting p-type polymer layers on n-type Si have been widely studied for the fabrication of cost-effective hybrid solar cells. In this work, time-of-flight secondary ion mass spectrometry (TOF-SIMS) is used to provide three-dimensional chemical imaging of the interface between poly(3,4-ethylene-dioxythiophene):polystyrenesulfonate (PEDOT:PSS) and SiOx/Si in a hybrid solar cell. To minimize structural damage to the polymer layer, an Ar cluster sputtering source is used for depth profiling. The present result shows the formation of micropore defects in the interface region of the PEDOT:PSS layer on the SiOx/Si substrate. This interfacial micropore defect formation becomes more prominent with increasing thickness of the native oxide layer, which is a key device parameter that greatly affects the hybrid solar cell performance. Three-dimensional chemical imaging coupled with Ar cluster ion sputtering has therefore been demonstrated as an emerging technique for probing the interface of this and other polymer-inorganic systems.