Optical characterization of interface disorder in GaAs-Ga1-xAlxAs multi-quantum well structures
Optical characterization of interface disorder in GaAs-Ga1-xAlxAs multi-quantum well structures
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DOI:
10.1016/0038-1098(81)90401-4
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发表时间:
1981-05
影响因子:
2.1
通讯作者:
C. Weisbuch;R. Dingle;A. Gossard;W. Wiegmann
中科院分区:
文献类型:
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作者:
C. Weisbuch;R. Dingle;A. Gossard;W. Wiegmann