Complete logic family using tunneling-phase-logic devices

Complete logic family using tunneling-phase-logic devices
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使用隧道相逻辑器件的完整逻辑系列

DOI:
10.1109/icm.2000.884828
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发表时间:
2000
期刊:
ICM'99. Proceedings. Eleventh International Conference on Microelectronics (IEEE Cat. No.99EX388)
影响因子:
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通讯作者:
Richard A. Kiehl
Richard A. Kiehl
中科院分区:
--
文献类型:
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作者:
Hossam A. H. Fahmy;Richard A. Kiehl

文献摘要

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本文介绍了所做的工作,开发和特性的二进制隧道相位逻辑(TPL)器件的行为。三个输入NAND,NOR和MINORITY功能演示使用一个单一的TPL元件。讨论了门的扇出以及级联中多门的负载效应。稳定的操作区域的报告和未来的研究可能性进行了探讨。
This paper presents the work done to develop and characterize the behavior of binary tunneling phase logic (TPL) devices. Three input NAND, NOR and MINORITY functions are demonstrated using a single TPL element. The fan-out of the gates is discussed as well as the loading effects of multiple gates in cascade. Stable regions of operation are reported and future research possibilities are explored.