Characterization of FeS2-Based Thin Films as Model Catalysts for the Oxygen Reduction Reaction
Characterization of FeS2-Based Thin Films as Model Catalysts for the Oxygen Reduction Reaction
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DOI：
10.1021/jp073395i
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发表时间：
2007-11
影响因子：
3.7
通讯作者：
D. Susac;L. Zhu;M. Teo;A. Sode;K. Wong;P. C. Wong;R. R. Parsons-R.;D. Bizzotto;K. Mitchell
中科院分区：
文献类型：
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作者：
D. Susac;L. Zhu;M. Teo;A. Sode;K. Wong;P. C. Wong;R. R. Parsons-R.;D. Bizzotto;K. Mitchell
研究了磁控溅射制备的FeS2和（Fe,Co）S2薄膜作为氧还原反应（ORR）的模型催化剂，并与溅射Pt薄膜的活性进行了比较。采用扫描俄格显微镜（SAM）、x射线光电子能谱（XPS）、能量色散x射线能谱（EDX）、x射线衍射（XRD）和微拉曼光谱进行了研究。同时利用薄膜作为旋转圆盘电极（RDE）进行电化学活性测量，以评估硫化膜的电化学性能与化学成分和结构之间的关系。我们还与矿物FeS2黄铁矿进行了比较，其开路电位（OCP）分别为0.62 V，远低于FeS2和（Fe,Co）S2薄膜的0.78和0.80 V（所有电位都是在可逆氢电极上给出的）。有迹象表明，这些影片的ORR活动可能与某些p…
FeS2 and (Fe,Co)S2 thin films prepared by magnetron sputtering have been investigated as model catalysts for the oxygen reduction reaction (ORR), and their activities were compared against that of a sputtered thin film of Pt. Scanning Auger microscopy (SAM), X-ray photoelectron spectroscopy (XPS), energy dispersive X-ray spectroscopy (EDX), X-ray diffraction (XRD), and micro-Raman spectroscopy have been used, in parallel with electrochemical activity measurements using the thin film as a rotating disk electrode (RDE), to assess how the electrochemical performances of the sulfide films relate to chemical composition and structure. Comparisons were also made against a mineral FeS2 pyrite whose open circuit potential (OCP) was 0.62 V and much less than the values of 0.78 and 0.80 V found for the FeS2 and (Fe,Co)S2 thin films, respectively (all potentials are given vs the reversible hydrogen electrode). There are indications that the ORR activities for these films may be associated with the presence of some p...