Femtosecond Time-Resolved Electron Microscopy
Femtosecond Time-Resolved Electron Microscopy
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DOI:
10.1002/ecj.11763
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发表时间:
2015-11
影响因子:
0.3
通讯作者:
Jinfeng Yang;Y. Yoshida;H. Shibata
中科院分区:
文献类型:
--
作者:
Jinfeng Yang;Y. Yoshida;H. Shibata
SUMMARY The revealing and understanding of ultrafast structural-change induced dynamics not only are essential in physics, chemistry, and biology, but also are indispensable for the development of new materials, new devices, and applications. A new radio-frequency electron gun-based ultrafast relativistic electron microscopy (UEM) is being developed at Osaka University to for direct probing structural changes at the atomic scale with sub-100 fs temporal resolution in materials. The first prototype femtosecond time-resolved relativistic-energy UEM was constructed at end of October 2012. Both relativistic-energy electron diffraction and image measurements have been successfully performed using a femtosecond electron beam. In this paper, the development of the UEM prototype and the first experiments on relativistic-energy electron imaging are reported.