Femtosecond Time-Resolved Electron Microscopy

Femtosecond Time-Resolved Electron Microscopy
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DOI:
10.1002/ecj.11763
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发表时间:
2015-11
影响因子:
0.3
通讯作者:
Jinfeng Yang;Y. Yoshida;H. Shibata
Jinfeng Yang;Y. Yoshida;H. Shibata
中科院分区:
工程技术4区
文献类型:
--
作者:
Jinfeng Yang;Y. Yoshida;H. Shibata

文献摘要

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超快结构变化诱导动力学的揭示和理解不仅在物理学、化学和生物学中是必不可少的,而且对于新材料、新器件和应用的开发也是必不可少的。大坂大学正在开发一种新的基于射频电子枪的超快相对论电子显微镜(UEM),用于直接探测材料中原子尺度的结构变化,时间分辨率低于100 fs。第一个飞秒时间分辨相对论能量UEM原型于2012年10月底建成。相对论能量电子衍射和图像测量已成功地进行使用飞秒电子束。在本文中,UEM原型的发展和相对论能量电子成像的第一个实验的报告。
SUMMARY The revealing and understanding of ultrafast structural-change induced dynamics not only are essential in physics, chemistry, and biology, but also are indispensable for the development of new materials, new devices, and applications. A new radio-frequency electron gun-based ultrafast relativistic electron microscopy (UEM) is being developed at Osaka University to for direct probing structural changes at the atomic scale with sub-100 fs temporal resolution in materials. The first prototype femtosecond time-resolved relativistic-energy UEM was constructed at end of October 2012. Both relativistic-energy electron diffraction and image measurements have been successfully performed using a femtosecond electron beam. In this paper, the development of the UEM prototype and the first experiments on relativistic-energy electron imaging are reported.