Superresolution by localization of quantum dots using blinking statistics
Superresolution by localization of quantum dots using blinking statistics
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DOI：
10.1364/opex.13.007052
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发表时间：
2005-09-05
期刊：
影响因子：
3.8
通讯作者：
Heintzmann, R
中科院分区：
文献类型：
--
作者：
Lidke, KA;Rieger, B;Heintzmann, R
在显微镜中，单个荧光点源的定位精度可以比显微镜的分辨率极限高几倍。我们表明，可以通过独立成分分析来分析量子点的间歇性荧光或“闪烁”，从而识别每个纳米颗粒发出的光，对其进行精确定位，从而解析紧密间隔的组（
In microscopy, single fluorescence point sources can be localized with a precision several times greater than the resolution limit of the microscope. We show that the intermittent fluorescence or 'blinking' of quantum dots can analyzed by an Independent Component Analysis so as to identify the light emitted by each individual nanoparticle, localize it precisely, and thereby resolve groups of closely spaced (