Evidence for the leading role of the stacking-fault triangle in the Si(111) 1 x 1-->7 x 7 phase transition.
Evidence for the leading role of the stacking-fault triangle in the Si(111) 1 x 1-->7 x 7 phase transition.
复制标题
堆垛层错三角形在 Si(111) 1 x 1-->7 x 7 相变中起主导作用的证据。
DOI:
10.1103/physrevb.51.14594
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发表时间:
1995
期刊:
影响因子:
--
通讯作者:
Ohdomari
中科院分区:
文献类型:
--
作者:
Hoshino;Kumamoto;Kokubun;Ishimaru;Ohdomari
In situ scanning-tunneling-microscopy (STM) observations at temperatures up to 600 C provide atomic-scale evidence, demonstrating that the formation of the stacking-fault (SF) half-unit plays the leading role in the growth of 7× 7 reconstructed domains of Si (111) surfaces from the 1× 1 phase upon supercooling. The concept of the SF leading role accounts for the fact that all of the 7× 7 reconstructed areas on Si (111) supercooled surfaces form triangular domains with vertices pointing in< 1 1 2> directions. The STM data suggest that the formation of the SF half-unit involves the construction of dimer chains and corner holes. A similar leading role of the SF half-unit is also deduced to be fundamental for the growth of 5× 5 or 9× 9 metastable structures.