Orientation dependence of transport property and microstructural characterization of Al-doped ZnO ceramics
Orientation dependence of transport property and microstructural characterization of Al-doped ZnO ceramics
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DOI：
10.1016/j.actamat.2007.04.046
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发表时间：
2007-08
期刊：
影响因子：
9.4
通讯作者：
H. Kaga;Y. Kinemuchi;H. Yilmaz;K. Watari;H. Nakano;Hiroshi Nakano;S. Tanaka;A. Makiya;Z. Kato;K. Uematsu
中科院分区：
文献类型：
--
作者：
H. Kaga;Y. Kinemuchi;H. Yilmaz;K. Watari;H. Nakano;Hiroshi Nakano;S. Tanaka;A. Makiya;Z. Kato;K. Uematsu
研究了高磁场取向法制备的掺铝ZnO陶瓷的热电性能与晶体织构强度的关系。织构强度与电导率的关系表现出独特的特点，电导率随织构强度的增加而增加，而塞贝克系数几乎与织构强度无关。理论计算表明，电导率不仅与晶体取向有关，还与晶界结构有关。高分辨率透射电镜显示，在晶界处未观察到界面层或铝的偏析；然而，重合点阵（如Σ49）在较高的织构强度下被观察到，这表明独特的微观结构是导致这些输运差异的主要原因。
The correlation between thermoelectric properties and crystallographic texture strengths of Al-doped ZnO ceramics prepared by the high magnetic field alignment method was investigated. The relationship between texture strength and electrical conductivity showed a unique characteristic, in which electrical conductivity increased with increasing texture strength, while the Seebeck coefficient was almost independent of the texture strength. Theoretical calculation indicated that the electrical conductivity was not only a function of crystal orientation but also of grain boundary structures. High-resolution transmission electron microscopy revealed that an interfacial layer or segregation of Al at grain boundaries was not observed; however, the coincidence site lattice such as Σ49 was observed at higher texture strength, suggesting that the unique microstructure was the main cause of these transport differences.