A new method for obtaining antenna gain from backscatter measurements
A new method for obtaining antenna gain from backscatter measurements
复制标题
一种从反向散射测量中获取天线增益的新方法
DOI：
--
复制
发表时间：
1990
期刊：
影响因子：
--
通讯作者：
T. Lee
中科院分区：
文献类型：
--
作者：
K. Lambert;R. Rudduck;T. Lee
提出了一种通过分析天线的反向散射数据来确定天线增益的方法。这种方法与过去提出的方法不同，因为它考虑了反向散射测量期间天线中可能发生的谐振的存在。特别是，这种类型的谐振出现在对称反射器天线的反向散射测量中。该技术用于确定 Ka 波段卡塞格伦天线和 X 波段主聚焦馈电天线的增益。 >
A method is presented for determining the gain of an antenna from analysis of backscatter data of the antenna. This approach is different from those which have been presented in the past because it accounts for the presence of resonances which can occur in the antenna during a backscatter measurement. In particular, this type of resonance appears in the backscatter measurement of symmetric reflector antennas. This technique is applied to determine the gain of a Ka-band Cassegrain antenna and an X-band prime focus-fed antenna. >