Direct determination by low-energy electron diffraction of the atomic structure of surface layers on a known substrate
Direct determination by low-energy electron diffraction of the atomic structure of surface layers on a known substrate
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通过低能电子衍射直接测定已知基材表面层的原子结构
DOI:
10.1103/physrevb.67.125417
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发表时间:
2003
期刊:
影响因子:
--
通讯作者:
D. Saldin
中科院分区:
文献类型:
--
作者:
A. Seubert;K. Heinz;D. Saldin
We develop a technique for the direct determination, by low-energy electron diffraction ~LEED! ,o f the atomic structure of surface layers on a known substrate. The key is the division of multiple-scattering paths into those that scatter solely from the known bulk of the sample and those that include scattering by a surface atom. In a holographic analogy, the sum of the contributions from the former may be identified with a~known! reference wave, and those from the surface with an ~unknown! object wave. The latter may be written as a linear combination of elementary object waves, each of which may be regarded as a renormalized dynamical structure factor of a test two-dimensional ~2D! superlattice of average atoms within a preselected 3D surface slab overlying the bulk crystal. The coefficients of this linear expansion, which may be determined by a maximum entropy algorithm, represent the 3D distribution of atoms within the surface slab. Examples are given of applications of the method for the determination of structures of adsorbates on known substrates from both simulated and experimental LEED data.