Measurement of Low Temperature-Grown GaAs Carrier Lifetime by Double Pump Terahertz Time-Domain Spectroscopy
Measurement of Low Temperature-Grown GaAs Carrier Lifetime by Double Pump Terahertz Time-Domain Spectroscopy
复制标题
双泵浦太赫兹时域光谱测量低温生长砷化镓载流子寿命
DOI:
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发表时间:
2014
期刊:
影响因子:
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通讯作者:
and M. Tani
中科院分区:
文献类型:
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作者:
V. K. Mag-usara;S. Funker;G. Niehues;E. A. Prieto;A. Somintac;E. Estacio;A. Salvador;K. Yamamoto;M. Hase;and M. Tani