SPONTANEOUS PHASE FLUCTUATIONS OF NANOPARTICLES OF LEAD IN A SILICON-OXIDE MATRIX
SPONTANEOUS PHASE FLUCTUATIONS OF NANOPARTICLES OF LEAD IN A SILICON-OXIDE MATRIX
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DOI：
10.1209/0295-5075/26/4/005
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发表时间：
1994-05-01
期刊：
影响因子：
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通讯作者：
KOFMAN, R
中科院分区：
文献类型：
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作者：
STELLA, A;MIGLIORI, A;KOFMAN, R
我们目前的室温高分辨率电子显微镜（HREM）的数据和光学反射率的结果，在λ = 0.6妈妈在300-600 K的温度范围内的Pb颗粒，具有从15到3 nm的尺寸和嵌入在矩阵的非晶SiO。HREM给出了颗粒的三种不同的尺寸依赖性机制的清晰指示，其被解释为在约10（-5）nm的范围内的直径发生的自发相位波动，其中示出了典型的固-液转变的反射率上升经历逐渐减小。
We present room temperature high-resolution electron microscopy (HREM) data and optical-reflectivity results at lambda = 0.6 mum in the temperature range 300-600 K on Pb particles, having dimensions from 15 down to 3 nm and embedded in a matrix of amorphous SiO. HREM gives a clear indication of three different size-dependent regimes for the particles, which are interpreted in terms of spontaneous phase fluctuations occurring for diameters in the range approximately 10(-5) nm, where the reflectivity rise typical of the solid-liquid transition is shown to undergo a progressive decrease.