Full-field x-ray fluorescence imaging microscope with a Wolter mirror
Full-field x-ray fluorescence imaging microscope with a Wolter mirror
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带 Wolter 镜的全视场 X 射线荧光成像显微镜
DOI：
10.1063/1.1150454
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发表时间：
2000
影响因子：
1.6
通讯作者：
M. Ando
中科院分区：
文献类型：
--
作者：
A. Takeuchi;S. Aoki;Kimitake Yamamoto;H. Takano;N. Watanabe;M. Ando
使用Wolter型反射镜（10倍放大）获得全场X射线荧光（XRF）和透射X射线显微图像。来自Photon Factory的偏转磁体束线的同步加速器辐射白色束（4-20 keV）用于获得XRF图像，并且常规实验室X射线源（8.04 keV）用于获得透射X射线图像。估计了相干和非相干散射X射线对X射线荧光图像对比度的影响。当入射X射线水平偏振时，入射X射线与X射线荧光显微镜光轴之间的散射角应为90°，以获得最高对比度的图像。对合成金刚石中的小金属夹杂物的观察表明，XRF图像的对比度优于透射X射线图像的对比度。
Full-field x-ray fluorescence (XRF) and transmission x-ray microscopic images were obtained with a Wolter-type mirror (10× magnification). A synchrotron radiation white beam (4–20 keV) from a bending magnet beamline at the Photon Factory was used to obtain XRF images and a conventional laboratory x-ray source (8.04 keV) was used to obtain transmission x-ray images. The effects of the coherent and the incoherent scattering x rays on the contrast of an XRF image were estimated. The scattering angle between the incidence x ray and the optical axis of the XRF microscope should be 90° to obtain the highest contrast image when the incidence x ray is horizontally polarized. Observation of small metallic inclusions in the synthesized diamond showed that the contrast of the XRF image was better than that of the transmission x-ray image.