X-ray Diffraction Study of Mixed-Layer Compounds in the PbTe–Bi2Te3System
X-ray Diffraction Study of Mixed-Layer Compounds in the PbTe–Bi2Te3System
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DOI:
10.1023/a:1013639108297
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发表时间:
2002
影响因子:
0.8
通讯作者:
O. G. Karpinskii;L. E. Shelimova;E. S. Avilov;M. Kretova;V. Zemskov
中科院分区:
文献类型:
--
作者:
O. G. Karpinskii;L. E. Shelimova;E. S. Avilov;M. Kretova;V. Zemskov