Multiscale finite element simulations of piezoelectric materials based on two- and three-dimensional electron backscatter diffraction–measured microstructures
Multiscale finite element simulations of piezoelectric materials based on two- and three-dimensional electron backscatter diffraction–measured microstructures
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基于二维和三维电子背散射衍射测量微结构的压电材料的多尺度有限元模拟
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发表时间：
2012
期刊：
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通讯作者：
M. Kamlah
中科院分区：
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作者：
Y. Uetsuji;S. Kimura;H. Kuramae;K. Tsuchiya;M. Kamlah
本文提出了一种计算方法，用于评估多晶压电材料的有效均匀化材料特性，并基于电子背散射衍射晶体取向测量构建二维和三维真实的微结构模型。利用电子背散射衍射技术研究了多晶压电材料钛酸钡的微观结构特征，并采用非晶锇涂层防止其带电。将电子背散射衍射测量获得的真实晶体取向引入基于均匀化理论的多尺度有限元模拟中，揭示宏观结构与微观结构之间的关系。首先，建立了二维微结构模型，分析了电子背散射衍射测量晶体取向的取样面积的影响。我们讨论了从两个角度确定的代表性体积元：宏观均匀化的材料性能和微观局部化的材料行为响应外载荷。然后对试样表面进行定期研磨抛光，并反复进行电子背散射衍射测量。然后，通过将面内晶体取向沿面外方向沿着堆叠，构建了三维微结构模型，并研究了表征面外方向堆叠尺寸的微结构厚度对模型的影响。我们比较了宏观结构均匀化的材料性能之间的二维和三维微观结构。
This article presents a computational procedure for evaluating effective homogenized material properties of polycrystalline piezoelectric materials and constructing two- and three-dimensional realistic microstructure models based on electron backscatter diffraction crystal orientation measurement. Microstructural features of a polycrystalline piezoelectric material, barium titanate, were investigated through electron backscatter diffraction measurements using an amorphous osmium coating to prevent charging. Realistic crystal orientations obtained from the electron backscatter diffraction measurements were introduced into multiscale finite element simulations based on homogenization theory to reveal the relationship between the macrostructure and the microstructure. First, a two-dimensional microstructural model was constructed, and the effect of the sampling area of the electron backscatter diffraction–measured crystal orientations was analyzed. We discuss the representative volume element determined from two points of view: the macroscopic homogenized material properties and the microscopic localized material behavior in response to external loads. Second, the surface of specimen was ground and polished at regular intervals and was measured by electron backscatter diffraction iteratively. Then a three-dimensional microstructural model was constructed by stacking in-plane crystal orientations in series along the out-of-plane direction, and the influence of the microstructural thickness, which indicates the stacking dimension in the out-of-plane direction, was investigated. We compare the macrostructural homogenized material properties between the two- and three-dimensional microstructures.