Radiation levels at CERN's injectors and their impact on electronic equipment
Radiation levels at CERN's injectors and their impact on electronic equipment
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CERN 注入器的辐射水平及其对电子设备的影响
DOI：
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发表时间：
2013
期刊：
影响因子：
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通讯作者：
M. Brugger
中科院分区：
文献类型：
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作者：
J. Saraiva;M. Brugger
在恶劣的辐射环境中工作的电子设备，例如在高能粒子加速器附近发现的那些电子设备，可能会遭受不同类型的辐射引起的故障。在欧洲核子研究中心，大型强子对撞机（LHC）及其注入器链中存在的混合粒子和能量辐射场可能会产生随机和累积效应，导致暴露的电子设备和材料的辐射诱导故障，从而直接影响组件和系统的寿命以及维护要求。由于其最初的重点是LHC，辐射到电子（R2 E）项目已成功实施缓解行动，以避免由于辐射引起的有源电子故障而导致加速器停机。下一步的重点是欧洲核研究组织的注入器链，收集有关辐射水平的现有信息，确定额外的监测要求，并对目前和未来的设备安装进行批判性分析。本文首先概述了所做的工作，并介绍了两个案例研究，包括各自的FLUKA蒙特-卡罗计算，涉及安装或将安装在注入器链中的电子设备辐射电子（R2 E）辐射电子（R2 E）项目[1]于2007年开始，旨在增加LHC的平均故障间隔时间（MTBF）。对于辐射引起的电子故障，超过1周[2]，即对于标称LHC峰值光度：10 cm−2s−1和年积分光度约为50 fb−1，低于0.5束流转储/逆飞秒（fb−1）。由于在过去几年中采取的缓解措施，LHC每年的运行停机时间已经成功地减少，如图1所示。图1：R2 E停机时间。cern.ch几年后，LHC的详细信息现在已经可以获得，这是基于详尽的监测计划和广泛的蒙特-卡罗模拟。从2012年开始，重点放在LHC注入器链上，因为较低的注入器停机时间也有助于减少LHC停机时间。在这方面，第一步是建立一个关于注入器辐射水平和监测的现有信息清单。在感兴趣的区域安装了额外的剂量计，并将其分析与现有的蒙特卡罗计算相结合，以便进行第一次基准研究，如下文进一步所述。
Electronic devices operating in hostile radiation environments, such as those found close to high-energy particle accelerators, can suffer from different types of radiation induced failures. At CERN, the mixed particle and energy radiation fields present at the Large Hadron Collider (LHC) and its injector chain can give rise to both stochastic and cumulative effects causing radiation induced failures of exposed electronics and materials, thus directly impacting component and system lifetimes, as well as maintenance requirements. With its original focus on the LHC, the Radiation to Electronics (R2E) project has been successfully implementing mitigation actions in order to avoid accelerator downtime due to radiation induced failures on active electronics. In a next step, the emphasis is put on CERN’s injector chain, collecting the respective available information about radiation levels, the definition of additional monitoring requirements and a critical analysis of present and future equipment installations. This paper provides a first overview of the work performed and presents two case studies including respective FLUKA Monte-Carlo calculations concerning electronic devices installed or to be installed in the injector chain RADIATION TO ELECTRONICS (R2E) The Radiation to Electronics (R2E) project [1] started in 2007 with the aim of increasing the LHC mean time between failures (MTBF) above 1 week for electronic failures caused by radiation [2], i.e. below 0.5 beam dumps per inverse femtobarn (fb−1) for the nominal LHC peak luminosity: ∼10 cm−2s−1 and a yearly integrated luminosity around 50 fb−1. Due to mitigation actions performed during the last years, the annual LHC operation downtime has been successfully decreasing as depicted in Fig. 1. Figure 1: R2E downtime. ∗ joao.pedro.saraiva@cern.ch After several years, for the LHC detailed information is now available, based on an exhaustive monitoring program combined with extensive set of Monte-Carlo simulations. As from 2012, the emphasis was put on the LHC injector chain since a lower injector downtime should also contribute to the reduction of the LHC downtime. In this context, in a first step an inventory of the existing information on radiation levels and monitoring in the injectors was created. Additional dosimeters were installed in areas of interest and their analysis combined with available Monte Carlo calculations in order to perform first benchmark studies, as further described below.