Characterization of a Pixelated CdTe X-Ray Detector Using the Timepix Photon-Counting Readout Chip
Characterization of a Pixelated CdTe X-Ray Detector Using the Timepix Photon-Counting Readout Chip
复制标题
使用 Timepix 光子计数读出芯片表征像素化 CdTe X 射线探测器
DOI：
10.1109/tns.2012.2210909
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发表时间：
2012
影响因子：
1.8
通讯作者：
C. Ponchut
中科院分区：
文献类型：
--
作者：
M. Ruat;C. Ponchut
将1 mm厚的CdTe探测器与256*256像素、间距为55 μ m的Timepix芯片结合，在高能同步加速器光束线（能量范围30-100 keV）上作为光子计数成像探测器进行了评估。对系统进行了完整的表征。粉末衍射实验也已在ESRF使用单色光束进行。与硅像素探测器和类似像素尺寸的当前CCD系统相比，在30 keV以上的能量下，预期的效率增益得到了证明，空间分辨率也得到了提高。使用Timepix能量阈值功能获得无背景粉末衍射光谱。能量分辨检测能力受到强电荷共享的限制。阻止在同步加速器X射线源中更广泛地使用这些装置的主要限制是表现出许多缺陷的CdTe晶体缺乏均匀性，以及大视场的不可用性。
A prototype 1mm thick CdTe detector bonded to a Timepix chip with 256*256 pixels at 55 μ m pitch was evaluated for use as a photon-counting imaging detector at high energy synchrotron beamlines (energy range 30-100 keV). A complete characterization of the system was performed. Powder diffraction experiments have also been conducted using a monochromatic beam at the ESRF. The expected gain in efficiency at energies above 30 keV with reference to silicon pixel detectors and current CCD systems of similar pixel size was demonstrated, together with an improved spatial resolution. Background-free powder diffraction spectra were obtained using the Timepix energy thresholding feature. The energy-resolved detection capabilities are limited by a strong charge sharing. The major limitations preventing a wider use of these devices at synchrotron X-ray sources are the lack of homogeneity of the CdTe crystal which exhibits numerous defects, and the unavailability of large fields of view.