YBa2Cu3Ox/PrBa2Cu3Ox/YBa2Cu3Ox Josephson ramp junctions
YBa2Cu3Ox/PrBa2Cu3Ox/YBa2Cu3Ox Josephson ramp junctions
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YBa2Cu3Ox/PrBa2Cu3Ox/YBa2Cu3Ox 约瑟夫森斜坡结
DOI:
10.1063/1.351835
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发表时间:
1992
影响因子:
3.2
通讯作者:
H. Rogalla
中科院分区:
文献类型:
--
作者:
Jun Gao;Y. Boguslavskij;B. Klopman;D. Terpstra;R. A. Wijbrans;G. Gerritsma;H. Rogalla
A detailed study of the fabrication process, current voltage (I‐V) characteristics, and Josephson and normal‐state properties of the YBa2Cu3Ox(YBCO)/PrBa2Cu3Ox(PBCO)/YBCO ramp junctions is presented. The I‐V characteristics can be well described by the resistively shunted junction model. It was found that the critical current Ic and the normal‐state conductance 1/Rn scale linearly with the junction area, whereas Ic, the excess current Iex, and IcRn products decrease with increasing barrier thickness. These junctions with cross‐sectional area A have a good controllability, low capacitance, and high values of IcRn and RnA products. The coherence length ξn of the PBCO barrier is estimated to be between 5 and 8 nm. As unambiguous evidence of the Josephson behavior, the microwave response as a function of the microwave power as well as the modulations of critical current Ic(H) with applied magnetic field are shown. A modulation depth of more than 95% has been observed. Small proximity effect parameters and jun...