Studies of nanomagnetism using synchrotron-based x-ray photoemission electron microscopy (X-PEEM)
Studies of nanomagnetism using synchrotron-based x-ray photoemission electron microscopy (X-PEEM)
复制标题
使用基于同步加速器的 X 射线光电子显微镜 (X-PEEM) 研究纳米磁性
DOI：
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发表时间：
2012
期刊：
影响因子：
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通讯作者：
David Keavney
中科院分区：
文献类型：
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作者：
Xuemei Cheng;David Keavney
过去 20 年来，随着人们对磁性器件的兴趣不断增加，对纳米磁性的研究也相应增长。从磁存储到磁逻辑的设备应用引起了人们对几何形状和有限尺寸对磁性和磁激励的影响的兴趣，特别是在最小尺寸达到重要的磁相互作用长度尺度的情况下。纳米级磁体的动力学行为是研究中特别重要的一个子集，因为这些现象对于器件物理至关重要，并且深受有限尺寸的影响。与此同时，纳米级系统提供了独特的几何形状来促进和研究模型系统，例如磁涡流，从而对磁化动力学产生新的基本见解。大量的实验和计算技术已被应用于解决这些问题。其中，提供磁序真实空间信息的成像技术特别有用。与扫描探针或光学技术相比，X 射线显微镜具有多种优势，例如高空间分辨率、元素特异性和高时间分辨率的可能性。在这里，我们回顾了最近使用静态和时间分辨 X 射线光电子显微镜对纳米磁性研究的贡献。
As interest in magnetic devices has increased over the last 20 years, research into nanomagnetism has experienced a corresponding growth. Device applications from magnetic storage to magnetic logic have compelled interest in the influence of geometry and finite size on magnetism and magnetic excitations, in particular where the smallest dimensions reach the important magnetic interaction length scales. The dynamical behavior of nanoscale magnets is an especially important subset of research, as these phenomena are both critical for device physics and profoundly influenced by finite size. At the same time, nanoscale systems offer unique geometries to promote and study model systems, such as magnetic vortices, leading to new fundamental insights into magnetization dynamics. A wide array of experimental and computational techniques have been applied to these problems. Among these, imaging techniques that provide real-space information on the magnetic order are particularly useful. X-ray microscopy offers several advantages over scanning probe or optical techniques, such as high spatial resolution, element specificity and the possibility for high time resolution. Here, we review recent contributions using static and time-resolved x-ray photoemission electron microscopy to nanomagnetism research.
影响因子：
2.2
作者：
G. Rempfer;W. Skoczylas;O. Griffith
通讯作者：
G. Rempfer;W. Skoczylas;O. Griffith