Interference of Three Electron Waves and Its Application to Direct Visualization of Electric Fields
Interference of Three Electron Waves and Its Application to Direct Visualization of Electric Fields
复制标题
三电子波的干涉及其在电场直接可视化中的应用
DOI：
10.1016/s1044-5803(99)00014-5
复制
发表时间：
1999
影响因子：
4.7
通讯作者：
T. Hirayama
中科院分区：
文献类型：
--
作者：
T. Hirayama
我们提出了一种三电子波干涉的方法，并将其应用于电磁微场等纯相位物体的直接可视化。利用配备有场发射电子枪和两个电子双棱镜的透射电子显微镜，在物波两侧叠加一个物波和两个参考波，产生一种新型的干涉图案。在该图案中，物波的等相线直接显示为周期性干涉条纹的强度调制。观察到了电子束辐照乳胶粒子周围产生的电场。根据观测到的相移，该粒子的电荷估计为6.4x10−17C，相当于约400个电子。动态观察了高温下带电氧化铝颗粒周围电场的变化。
We present a method for the interference of three electron waves and its application to direct visualization of pure-phase objects such as electromagnetic microfields. Using a transmission electron microscope equipped with a field-emission electron gun and two electron biprisms, an object wave and two reference waves at either side of the object wave are superposed to produce a new type of interference pattern. In this pattern, equal-phase lines of the object wave are directly displayed as intensity modulation of periodic interference fringes. An electric field around a latex particle, induced by electron-beam irradiation, has been observed. The electric charge of the particle is estimated, from an observed phase shift, to be 6.4 × 10−17C, which is equal to about 400 electrons. A change of the electric field around charged alumina particles at high temperatures has been observed dynamically.