Interference fringes observed in electron emission patterns of a multi-wall carbon nanotube
Interference fringes observed in electron emission patterns of a multi-wall carbon nanotube
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DOI：
10.1116/1.1722133
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发表时间：
2003-07
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影响因子：
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通讯作者：
K. Hata;Akihiro Takakura;Kenji Miura;A. Ohshita;Yahachi Saito
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文献类型：
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作者：
K. Hata;Akihiro Takakura;Kenji Miura;A. Ohshita;Yahachi Saito
具有清洁表面的多壁碳纳米管的场电子发射图案表现出源自位于尖端的五边形的精细结构。场发射显微镜（FEM）分辨出六个五边形，每个五边形的中心都有一个小黑点。此外，在相邻五边形之间的边界区域观察到明亮的条纹。Oshima等人（2002）根据两光束的杨氏干涉公式进行了计算，认为观察到的条纹是干涉条纹。本文用实验结果证明了这些条纹是杨氏干涉条纹。
Field electron emission patterns from a MWNT with clean surface exhibit fine structures originating from pentagons located at the tip end. The field emission microscopy (FEM) has resolved six pentagons each of which has a small dark spot in its center. Moreover, the bright streaks have been observed at the boundary regions between adjacent pentagons. By calculations based on the formula of Young's interference of two beams, Oshima et al. (2002) reported that the observed streaks are interference fringes. In this paper, we show experimental results to prove that the streaks are Young's interference fringes.