Selective sensitivity in Kerr microscopy.
Selective sensitivity in Kerr microscopy.
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DOI：
10.1063/1.4991820
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发表时间：
2016-11
期刊：
影响因子：
--
通讯作者：
I. Soldatov;R. Schafer
中科院分区：
文献类型：
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作者：
I. Soldatov;R. Schafer
介绍了一种宽场磁光克尔显微镜中的对比度分离新技术。利用8个发光二极管发出的光，通过玻璃纤维引导到显微镜，并与相机曝光同步切换，可以同时实时显示具有正交面内灵敏度的域图像，并可以获得具有纯面内或极差对比度的图像。坡莫合金薄膜，钕铁硼烧结磁体，钴晶体证明了这种新的方法的对比度分离的好处。此外，新技术显示，通过消除寄生对比度的贡献发生在传统的设置，大大提高克尔显微镜的灵敏度。证明了面内域对比度的加倍和对低至0.6毫度的克尔旋转的敏感性。
A new technique for contrast separation in wide-field magneto-optical Kerr microscopy is introduced. Utilizing the light from eight light emitting diodes, guided to the microscope by glass fibers and being switched synchronously with the camera exposure, domain images with orthogonal in-plane sensitivity can be displayed simultaneously at real-time, and images with pure in-plane or polar contrast can be obtained. The benefit of this new method of contrast separation is demonstrated for Permalloy films, a NdFeB sinter magnet, and a cobalt crystal. Moreover, the new technique is shown to strongly enhance the sensitivity of Kerr microscopy by eliminating parasitic contrast contributions occurring in conventional setups. A doubling of the in-plane domain contrast and a sensitivity to Kerr rotations as low as 0.6 mdeg is demonstrated.