Transmission electron microscopy observation of the half-Heusler compound Ti0.5(Zr0.5Hf0.5)0.5NiSn0.998Sb0.002
Transmission electron microscopy observation of the half-Heusler compound Ti0.5(Zr0.5Hf0.5)0.5NiSn0.998Sb0.002
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DOI:
10.1016/j.scriptamat.2008.06.039
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发表时间:
2008-10
影响因子:
6
通讯作者:
T. Morimura;M. Hasaka;S. Kondo
中科院分区:
文献类型:
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作者:
T. Morimura;M. Hasaka;S. Kondo
The high-performance thermoelectric compound Ti{sub 0.5}(Zr{sub 0.5}Hf{sub 0.5}){sub 0.5}NiSn{sub 0.998}Sb{sub 0.002} with half-Heusler lattice was studied by X-ray diffraction (XRD) and transmission electron microscopy (TEM). Each half-Heusler peak in the XRD pattern was accompanied by a bump at the high-angle side. Granular domains, a few nanometers in size, were observed in a bright-field TEM image. Fourier transformation and inverse Fourier transformation of the high-resolution TEM image revealed that the granular structure consists of half-Heusler domains with ordering and with disordering between second nearest neighbor atoms.