Infrared spectrum and potential constants of silicon tetrafluoride
Infrared spectrum and potential constants of silicon tetrafluoride
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四氟化硅的红外光谱和电位常数
DOI：
10.1063/1.444423
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发表时间：
1982
影响因子：
4.4
通讯作者：
G. Laguna
中科院分区：
文献类型：
--
作者：
R. McDowell;M. Reisfeld;C. W. Patterson;B. Krohn;M. Vasquez;G. Laguna
本文分析了28SiF_4 ~（ν4）的多普勒限制可调谐二极管激光光谱，确定了光谱常数。与大多数早期的低分辨率研究相反，当科里奥利常数ε 4与从先前的激光光谱学获得的ε 3相结合时，产生的zeta和在预期谐波值1/2的5%以内。12个泛音及其组合的谱带起源已从傅里叶变换光谱（0.04 cm−1分辨率）中获得，从而估计出非谐常数和谐波频率。根据科里奥利常数和ν3的同位素位移，我们重新确定了SiF 4的一般二次力场。
Doppler‐limited tunable diode laser spectra of ν4 of 28SiF4 have been analyzed and the spectroscopic constants determined. In contrast to most earlier low‐resolution studies, the Coriolis constant ζ4, when combined with ζ3 as obtained from previous laser spectroscopy, yields a zeta sum that is within 5% of the expected harmonic value of 1/2. The band origins of 12 overtones and combinations have been obtained from Fourier‐transform spectra (0.04 cm−1 resolution), resulting in estimates of the anharmonicity constants and harmonic frequencies. From the Coriolis constants and the isotope shifts in ν3 we have redetermined the general quadratic force field of SiF4.