Static test compaction for delay fault test sets consisting of broadside and skewed-load tests
Static test compaction for delay fault test sets consisting of broadside and skewed-load tests
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延迟故障测试装置的静态测试压实，包括宽边和偏斜负载测试
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发表时间：
2011
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通讯作者：
I. Pomeranz
中科院分区：
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作者：
I. Pomeranz
由宽频和偏载测试组成的测试集为标准扫描电路提供了改进的延迟故障覆盖。本文介绍了这种混合试验装置的静态试验压实过程。该程序的独特之处在于，如果有助于测试压实，它可以修改测试类型（从舷侧到斜载或从斜载到舷侧）。实验结果表明，该方法能够显著减小可用混合测试集的大小。此外，它在将大量测试包括在压缩测试集中之前修改它们的类型。
Test sets that consist of both broadside and skewed-load tests provide improved delay fault coverage for standard-scan circuits. This paper describes a static test compaction procedure for such mixed test sets. The unique feature of the procedure is that it can modify the type of a test (from broadside to skewed-load or from skewed-load to broadside) if this contributes to test compaction. Experimental results demonstrate that the procedure is able to reduce the sizes of available mixed test sets significantly. Moreover, it modifies the types of significant numbers of tests before including them in the compacted test set.