SIMPLE METHOD FOR DETERMINATION OF OPTICAL-CONSTANTS N,K AND THICKNESS OF A WEAKLY ABSORBING THIN-FILM
SIMPLE METHOD FOR DETERMINATION OF OPTICAL-CONSTANTS N,K AND THICKNESS OF A WEAKLY ABSORBING THIN-FILM
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DOI：
10.1088/0022-3735/9/11/032
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发表时间：
1976-01-01
期刊：
影响因子：
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通讯作者：
FILLARD, JP
中科院分区：
文献类型：
--
作者：
MANIFACIER, JC;GASIOT, J;FILLARD, JP
本文提出了一种新的计算方法，即用非吸收介质包围的透明介质薄膜透射谱的条纹图来计算薄膜的光学常数和厚度。这种方法的特别之处在于，除了它的简单性之外，它还可以直接编程计算;精度与迭代法相同。
A new calculation following traditional methods is proposed for deducing optical constants and thickness from the fringe pattern of the transmission spectrum of a thin transparent dielectric film surrounded by non-absorbing media. The particular interest of this method, apart from its easiness, is that it makes a directly programmable calculation possible; the accuracy is of the same order as for the iteration method.