Ken-ichi Kudo, Hironori Ito, Satoshi Ihara, Hiroaki Terato

Ken-ichi Kudo, Hironori Ito, Satoshi Ihara, Hiroaki Terato
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工藤健一、伊藤博典、井原聪、寺户博明

DOI:
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发表时间:
2015
影响因子:
1.8
通讯作者:
Quantitative analysis of oxidative DNA damage induced by high-voltage pulsed discharge with cavitation
Quantitative analysis of oxidative DNA damage induced by high-voltage pulsed discharge with cavitation
中科院分区:
工程技术4区
文献类型:
--
作者:
Naoto Yorino;Abdillah Muhammad;Yutaka Sasaki;and Yoshifumi Zoka;Quantitative analysis of oxidative DNA damage induced by high-voltage pulsed discharge with cavitation

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