Optical Surface Analysis of the Head-Disk-Interface of Thin Film Disks
Optical Surface Analysis of the Head-Disk-Interface of Thin Film Disks
复制标题
薄膜磁盘头-磁盘-界面的光学表面分析
DOI：
10.1115/1.2830584
复制
发表时间：
1995
影响因子：
2.5
通讯作者：
H. Rosen
中科院分区：
文献类型：
--
作者：
S. W. Meeks;W. Weresin;H. Rosen
本文介绍了光学表面分析仪（OSA）的设计，操作，理论和数据解释。OSA可以测量碳涂层薄膜磁盘上的碳磨损、润滑剂消耗/积聚、表面粗糙度和润滑剂变化。该设备可以测量碳磨损或润滑剂消耗/积聚的埃。OSA还可以通过测量光学指数变化来测量碎片生成和润滑剂降解。OSA的横向分辨率约为5 × 10微米，器件的带宽为2 MHz。设备尺寸小，可在测试台环境中使用
This paper describes the design, operation, theory, and data interpretation of an Optical Surface Analyzer (OSA). The OSA can measure carbon wear, lubricant depletion/accumulation, surface roughness, and lubricant alteration on carbon coated thin film disks. This device can measure an Angstrom of carbon wear or lubricant depletion/accumulation. The OSA can also measure debris generation and lubricant degradation through a measurement of optical index change. The lateral resolution of the OSA is approximately 5 by 10 microns and the bandwidth of the device is 2 MHz. The small device size allows it to be used within a test stand environment