Preparation of an oriented FIBbed Ti-6Al-4V sample for in situ TEM observations of dislocation transmission through alpha/beta interfaces
Preparation of an oriented FIBbed Ti-6Al-4V sample for in situ TEM observations of dislocation transmission through alpha/beta interfaces
复制标题
制备定向 FIBbed Ti-6Al-4V 样品，用于通过 α/β 界面进行位错传输的原位 TEM 观察
DOI：
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发表时间：
2011
期刊：
影响因子：
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通讯作者：
Joel Douin
中科院分区：
文献类型：
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作者：
Joel Douin
