Development of an objective crumb-grain measurement
Development of an objective crumb-grain measurement
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开发客观的碎粒测量方法
DOI：
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发表时间：
1995
期刊：
影响因子：
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通讯作者：
M. Olewnik
中科院分区：
文献类型：
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作者：
D. Rogers;D. Day;M. Olewnik
提出了一种基于标准文档扫描仪采集图像的傅立叶变换分析来表征面包屑颗粒的方法。通过估计局部区域内的平均细胞的光谱特性，使用经典的光谱估计技术来实现表征。然后从光谱估计中提取表征基本细胞结构的特征，并由经验丰富的烘焙师进行验证。碎屑评分参数包括复合细胞细度和伸长率。根据扫描的切片面积和产品长度计算体积估计值。还计算了地壳厚度和地壳对比度（暗度）。
A method of characterizing bread-crumb grain was developed, based on the Fourier transform analysis of images captured by a standard document scanner. The characterization was achieved by estimating the spectral character of an average cell within a localized area, using a classic spectral estimation technique. Quantities characterizing the basic cell structure then were extracted from the spectral estimate and verified by experienced bakers. Crumb score parameters included composite cell fineness and elongation. Volume estimates were calculated, based on the area of the slices scanned and product length. Crust thickness and crust contrast (darkness) were also computed.