Measurement of the index of refraction of micron-meter crystals by a confocal laser microscope - Potential application for the refractive index mapping of micron-meter scale
Measurement of the index of refraction of micron-meter crystals by a confocal laser microscope - Potential application for the refractive index mapping of micron-meter scale
复制标题
用共焦激光显微镜测量微米晶体的折射率 - 微米尺度折射率映射的潜在应用
DOI：
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发表时间：
2014
影响因子：
1.6
通讯作者：
K.Kimura and S.Sato
中科院分区：
文献类型：
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作者：
Keisaku Kimura and Seiichi Sato;K.Kimura and S.Sato
