Column-Parallel ADCs for CMOS Image Sensors and Their FoM-Based Evaluations
Column-Parallel ADCs for CMOS Image Sensors and Their FoM-Based Evaluations
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DOI:
10.1587/transele.e101.c.444
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发表时间:
2018-07-01
影响因子:
0.5
通讯作者:
Kawahito, Shoji
中科院分区:
文献类型:
--
作者:
Kawahito, Shoji
This paper reviews architectures and topologies for column-parallel analog-to-digital converters (ADCs) used for CMOS image sensors (CISs) and discusses the performance of CISs using column-parallel ADCs based on figures-of-merit (FoM) with considering noise models which behave differently at low/middle and high pixel-rate regions. Various FoM considering different performance factors are defined. The defined FoM are applied to surveyed data on reported CISs using column-parallel ADCs which are categorized into 4 types; single slope, SAR, cyclic and delta-sigma ADCs. The FoM defined by (noise)(2)(power)/(pixel-rate) separately for low/middle and high pixel-rate regions well explains the frontline of the CIS' performance in all the pixel rates. Using the FoM defined by (noise)(2)(power)/(intrascene dynamic range)(pixel-rate), the effectiveness of recently-reported techniques for extended-dynamic-range CISs is clarified.