A controlled Poisson Voronoi tessellation for grain and cohesive boundary generation applied to crystal plasticity analysis
A controlled Poisson Voronoi tessellation for grain and cohesive boundary generation applied to crystal plasticity analysis
复制标题
DOI：
10.1016/j.commatsci.2012.02.022
复制
发表时间：
2012-11-01
影响因子：
3.3
通讯作者：
Farrugia, Didier
中科院分区：
文献类型：
--
作者：
Zhang, Pan;Karimpour, Morad;Farrugia, Didier
提出了一种新的计算框架，用于大规模晶体塑性有限元（CPFE）分析中具有内聚边界的虚拟多晶晶粒结构的表示。该框架由晶粒结构生成模型、内聚区（CZ）表示和结划分方案组成。控制泊松Voronoi镶嵌（CPVT）模型被用来生成虚拟晶粒结构，统计等效于金相测量的晶粒尺寸分布。在CPVT模型中，包括平均晶粒尺寸、小晶粒尺寸、大晶粒尺寸和在此范围内的晶粒的百分比的物理参数用于确定晶粒尺寸分布。为了利用内聚区模型研究晶间裂纹的萌生和演化，提出了一种新型的晶界表示方案，用于产生Voronoi镶嵌的内聚界面并自动划分多个结。提出的虚拟晶粒结构生成模型和内聚边界生成方法在多晶拉伸的晶体塑性模拟中得到了验证。介绍了沿晶裂纹萌生和扩展的特点，讨论了其力学响应。(C)2012年爱思唯尔B。V.保留所有权利。
A novel computational framework is presented for the representation of virtual polycrystalline grain structures with cohesive boundaries for large-scale crystal plasticity finite element (CPFE) analyses. This framework consists of a grain structure generation model and cohesive zone (CZ) representation and junction partitioning scheme. The controlled Poisson Voronoi tessellation (CPVT) model is employed to generate virtual grain structures that are statistically equivalent to metallographic measurements in terms of grain size distribution. In the CPVT model, physical parameters including the mean grain size, a small grain size, a large grain size and the percentage of grains within this range are used to determine the grain size distribution. To study inter-granular crack initiation and evolution using the cohesive zone model, a novel grain boundary representation scheme is proposed for producing cohesive interfaces for Voronoi tessellations and automatically partitioning multiple junctions. The proposed virtual grain structure generation model and cohesive boundary generation method is demonstrated in a crystal plasticity simulation of polycrystal tension. The features of inter-granular crack initiation and propagation are presented and the mechanical response is discussed. (C) 2012 Elsevier B. V. All rights reserved.