Effects of chemical etching on structure and properties of Y 0.5 Gd 0.5 Ba 2 Cu 3 O 7-z coated conductors

Effects of chemical etching on structure and properties of Y 0.5 Gd 0.5 Ba 2 Cu 3 O 7-z coated conductors
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化学腐蚀对Y 0.5 Gd 0.5 Ba 2 Cu 3 O 7-z 涂层导体结构和性能的影响

DOI:
10.1016/j.ceramint.2018.05.221
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发表时间:
2018
影响因子:
5.2
通讯作者:
Y Zhao
Y Zhao
中科院分区:
材料科学1区
文献类型:
--
作者:
M J Wang;W T Wang;L Liu;F Scurti;Y D Xia;B L Huo;X Yang;Y Zhao

文献摘要

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耐腐蚀性是实现Y0.5Gd0.5Ba2Cu3O7-z(YGdBCO)涂层导体(CC)超导接头的关键性能。Cu和Ag金属层需要从待接合的导体区域完全去除,以允许穿过接合部的超导路径。因此,当使用湿法蚀刻工艺去除金属层时,蚀刻条件会显著影响接头性能。系统研究了氨水和过氧化氢混合化学腐蚀对YGdBCO陶瓷电容器晶体结构、表面微结构和临界电流的影响。我们发现,一组蚀刻参数,不影响导体的性能,离开IC的YGdBCO导体蚀刻后不变。然而,当蚀刻条件不是最佳的,减少在Ic被发现和驱动的退化的根本原因进行了调查。拉曼光谱和X射线衍射分析表明,还原的Icis主要是由于在YGdBCO晶格中的氧缺乏。
Corrosion resistance is a crucial property to achieve successful superconducting joints of Y0.5Gd0.5Ba2Cu3O7-z(YGdBCO) coated conductors (CCs). Cu and Ag metallic layers need to be fully removed from the area of conductor to be joint to allow for a superconducting path across the joint. Therefore, when using a wet etching process to remove the metallic layers, the joint performance can be significantly influenced by the etching conditions. The effects of chemical etching with ammonia water and hydrogen peroxide mixture on crystal structure, surface microstructure and critical current (Ic) of YGdBCO CCs were systematically investigated. We found the set of etching parameters that does not affect conductor performance, leaving the Icof the YGdBCO conductor unchanged upon etching. However, when the etching conditions are not optimal, decrease in Icwas found and the underlying reasons driving the degradation were investigated. Raman spectroscopy and XRD analysis indicated that the reduced Icis mainly due to oxygen deficiency in the YGdBCO crystal lattice.